A. N. Nazarov

According to our database1, A. N. Nazarov authored at least 5 papers between 2002 and 2007.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of five.

Timeline

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Bibliography

2007
Charge trapping characterization of MOCVD HfO<sub>2</sub>/p-Si interfaces at cryogenic temperatures.
Microelectron. Reliab., 2007

Charge accumulation in the dielectric of the nanocluster NVM MOS structures under anti- and unipolar W/E window formation.
Microelectron. Reliab., 2007

Charge trapping and interface states in hydrogen annealed HfO<sub>2</sub>-Si structures.
Microelectron. Reliab., 2007

2005
Charge storage peculiarities in poly-Si-SiO<sub>2</sub>-Si memory devices with Si nanocrystals rich SiO<sub>2</sub>.
Microelectron. Reliab., 2005

2002
Charge trapping and degradation in Ge<sup>+</sup> ion implanted SiO<sub>2</sub> layers during high-field electron injection.
Microelectron. Reliab., 2002


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