Thierry Kociniewski

According to our database1, Thierry Kociniewski authored at least 4 papers between 2013 and 2015.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of six.

Timeline

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Links

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Bibliography

2015
Temperature mapping by μ-Raman spectroscopy over cross-section area of power diode in forward biased conditions.
Microelectron. Reliab., 2015

Mechanical and thermal stresses characterization maps on cross-sections of forward biased electronic power devices.
Proceedings of the IEEE International Reliability Physics Symposium, 2015

2014
μ-Raman spectroscopy for stress analysis in high power silicon devices.
Microelectron. Reliab., 2014

2013
Distributed electro-thermal model of IGBT chip - Application to top-metal ageing effects in short circuit conditions.
Microelectron. Reliab., 2013


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