Thierry Parrassin

According to our database1, Thierry Parrassin authored at least 3 papers between 2010 and 2011.

Collaborative distances:
  • Dijkstra number2 of six.
  • Erdős number3 of five.

Timeline

Legend:

Book 
In proceedings 
Article 
PhD thesis 
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Links

On csauthors.net:

Bibliography

2011
Failure analysis defect location on a real case 55 nm memory using dynamic power supply emulation.
Microelectron. Reliab., 2011

LVI detection on passive structure in advance CMOS technology: New opportunities for device analysis.
Microelectron. Reliab., 2011

2010
Facing the defect characterization and localization challenges of bridge defects on a submicronic technology (45 nm and below).
Microelectron. Reliab., 2010


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