Philippe Perdu

According to our database1, Philippe Perdu authored at least 80 papers between 2001 and 2018.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

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On csauthors.net:

Bibliography

2018
Automatic localization of signal sources in photon emission images for integrated circuit analysis.
Signal Image Video Process., 2018

2017
Pattern image enhancement by automatic focus correction.
Microelectron. Reliab., 2017

Automatic defect localization in VLSI circuits: A fusion approach based on the Dempster-Shafer theory.
Proceedings of the 20th International Conference on Information Fusion, 2017

2016
Effects of voltage stress on the single event upset (SEU) response of 65 nm flip flop.
Microelectron. Reliab., 2016

Automatic process for time-frequency scan of VLSI.
Microelectron. Reliab., 2016

2015
A way to implement the electro-optical technique to inertial MEMS.
Microelectron. Reliab., 2015

Magnetic imaging for resistive, capacitive and inductive devices; from theory to piezo actuator failure localization.
Microelectron. Reliab., 2015

Unsupervised learning for signal mapping in dynamic photon emission.
Microelectron. Reliab., 2015

Improvement of signal to noise ratio in electro optical probing technique by wavelets filtering.
Microelectron. Reliab., 2015

Editorial.
Microelectron. Reliab., 2015

Unsupervised image processing scheme for transistor photon emission analysis in order to identify defect location.
J. Electronic Imaging, 2015

2014
A comprehensive study of the application of the EOP techniques on bipolar devices.
Microelectron. Reliab., 2014

Backside spectroscopic photon emission microscopy using intensified silicon CCD.
Microelectron. Reliab., 2014

Pattern image enhancement by extended depth of field.
Microelectron. Reliab., 2014

2013
Impact of negative bias temperature instability on the single-event upset threshold of a 65 nm SRAM cell.
Microelectron. Reliab., 2013

Frequency mapping in dynamic light emission with wavelet transform.
Microelectron. Reliab., 2013

2012
Optimum Si thickness for backside detection of photon emission using Si-CCD.
Microelectron. Reliab., 2012

High performance thermography with InGaAs photon counting camera.
Microelectron. Reliab., 2012

2011
Magnetic field spatial Fourier analysis: A new opportunity for high resolution current localization.
Microelectron. Reliab., 2011

Performance improvement of Si-CCD detector based backside reflected light and photon emission microscopy by FIB ultimate substrate thinning.
Microelectron. Reliab., 2011

LVI detection on passive structure in advance CMOS technology: New opportunities for device analysis.
Microelectron. Reliab., 2011

Time Resolved Imaging: From logical states to events, a new and efficient pattern matching method for VLSI analysis.
Microelectron. Reliab., 2011

2010
VLSI functional analysis by dynamic emission microscopy.
Microelectron. Reliab., 2010

Magnetic microscopy for ground plane current detection: a fast and reliable technique for current leakage localization by means of magnetic simulations.
Microelectron. Reliab., 2010

CADless laser assisted methodologies for failure analysis and device reliability.
Microelectron. Reliab., 2010

Facing the defect characterization and localization challenges of bridge defects on a submicronic technology (45 nm and below).
Microelectron. Reliab., 2010

When Failure Analysis Meets Side-Channel Attacks.
Proceedings of the Cryptographic Hardware and Embedded Systems, 2010

2009
Analysis of deep submicron VLSI technological risks: A new qualification process for professional electronics.
Microelectron. Reliab., 2009

Magnetic microscopy for 3D devices: Defect localization with high resolution and long working distance on complex system in package.
Microelectron. Reliab., 2009

2008
Failure Analysis enhancement by evaluating the Photoelectric Laser Stimulation impact on mixed-mode ICs.
Microelectron. Reliab., 2008

Fast and rigorous use of thermal time constant to characterize back end of the line test structure in advanced technology.
Microelectron. Reliab., 2008

Dynamic study of the thermal laser stimulation response on advanced technology structures.
Microelectron. Reliab., 2008

Effect of physical defect on shmoos in CMOS DSM technologies.
Microelectron. Reliab., 2008

Generic simulator for faulty IC.
Microelectron. Reliab., 2008

Analysis of traps effect on AlGaN/GaN HEMT by luminescence techniques.
Microelectron. Reliab., 2008

2007
Long-term reliability of silicon bipolar transistors subjected to low constraints.
Microelectron. Reliab., 2007

Study of passivation defects by electroluminescence in AlGaN/GaN HEMTS on SiC.
Microelectron. Reliab., 2007

Dynamic laser stimulation techniques for advanced failure analysis and design debug applications.
Microelectron. Reliab., 2007

Identification of process/design issues during 0.18 µm technology qualification for space application.
Proceedings of the 2007 Design, Automation and Test in Europe Conference and Exposition, 2007

2006
Application of various optical techniques for ESD defect localization.
Microelectron. Reliab., 2006

Time resolved imaging using synchronous picosecond Photoelectric Laser Stimulation.
Microelectron. Reliab., 2006

Descrambling and data reading techniques for flash-EEPROM memories. Application to smart cards.
Microelectron. Reliab., 2006

2005
NIR laser stimulation for dynamic timing analysis.
Microelectron. Reliab., 2005

Light Emission to Time Resolved Emission For IC Debug and Failure Analysis.
Microelectron. Reliab., 2005

Oxide charge measurements in EEPROM devices.
Microelectron. Reliab., 2005

Different Failure signatures of multiple TLP and HBM Stresses in an ESD robust protection structure.
Microelectron. Reliab., 2005

Impact of semiconductors material on IR Laser Stimulation signal.
Microelectron. Reliab., 2005

Failure analysis of micro-heating elements suspended on thin membranes.
Microelectron. Reliab., 2005

Dynamic Laser Stimulation Case Studies.
Microelectron. Reliab., 2005

Electrical Modeling for Laser Testing with Different Pulse Durations.
Proceedings of the 11th IEEE International On-Line Testing Symposium (IOLTS 2005), 2005

2004
Implementation of TRE systems into Emission Microscopes.
Microelectron. Reliab., 2004

Light Emission From Small Technologies. Are Silicon Based Detectors Reaching Their Limits?
Microelectron. Reliab., 2004

Low Frequency Noise Measurements for ESD Latent Defect Detection in High Reliability Applications.
Microelectron. Reliab., 2004

Understanding the effects of NIR laser stimulation on NMOS transistor.
Microelectron. Reliab., 2004

Study of the ESD defects impact on ICs reliability.
Microelectron. Reliab., 2004

Time Resolved Photon Emission Processing Flow for IC Analysis.
Microelectron. Reliab., 2004

Magnetic Microscopy for IC Failure Analysis: Comparative Case Studies using SQUID, GMR and MTJ systems.
Microelectron. Reliab., 2004

Femtosecond Laser Ablation for Backside Silicon Thinning.
Microelectron. Reliab., 2004

2003
TCAD and SPICE modeling help solve ESD protection issues in analog CMOS technology.
Microelectron. Reliab., 2003

Solar Cell Analysis with Light Emission and OBIC Techniques.
Microelectron. Reliab., 2003

Time Resolved Photoemission (PICA) - From the Physics to Practical Considerations.
Microelectron. Reliab., 2003

Short defect characterization based on TCR parameter extraction.
Microelectron. Reliab., 2003

Faster IC Analysis with PICA Spatial Temporal Photon Correlation and CAD Autochanneling.
Microelectron. Reliab., 2003

Magnetic emission mapping for passive integrated components characterisation.
Microelectron. Reliab., 2003

From Static Thermal and Photoelectric Laser Stimulation (TLS/PLS) to Dynamic Laser Testing.
Microelectron. Reliab., 2003

Characterization of ESD induced defects using Photovoltaic Laser Stimulation (PLS).
Microelectron. Reliab., 2003

A physical approach on SCOBIC investigation in VLSI.
Microelectron. Reliab., 2003

Thermal laser stimulation and NB-OBIC techniques applied to ESD defect localization.
Microelectron. Reliab., 2003

Fault Localization using Time Resolved Photon Emission and STIL Waveforms.
Proceedings of the Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September, 2003

2002
IR confocal laser microscopy for MEMS Technological Evaluation.
Microelectron. Reliab., 2002

Magnetic field measurements for Non Destructive Failure Analysis.
Microelectron. Reliab., 2002

Backside Hot Spot Detection Using Liquid Crystal Microscopy.
Microelectron. Reliab., 2002

Reliability Defect Monitoring with Thermal Laser Stimulation: Biased Versus Unbiased.
Microelectron. Reliab., 2002

Backside Defect Localizations and Revelations Techniques on Gallium Arsenide (GaAs) Devices.
Microelectron. Reliab., 2002

2001
Front Side and Backside OBIT Mappings applied to Single Event Transient Testing.
Microelectron. Reliab., 2001

A New Versatile Testing Interface for Failure Analysis in Integrated Circuits.
Microelectron. Reliab., 2001

Backside Localization of Current Leakage Faults Using Thermal Laser Stimulation.
Microelectron. Reliab., 2001

Silicon Thinning and Polishing on Packaged Devices.
Microelectron. Reliab., 2001

Modeling Thermal Laser Stimulation.
Microelectron. Reliab., 2001

Analysis and compact modeling of a vertical grounded-base n-p-n bipolar transistor used as ESD protection in a smart power technology.
IEEE J. Solid State Circuits, 2001


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