Tom Kopley

According to our database1, Tom Kopley authored at least 2 papers between 2013 and 2020.

Collaborative distances:
  • Dijkstra number2 of six.
  • Erdős number3 of six.

Timeline

Legend:

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PhD thesis 
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Links

On csauthors.net:

Bibliography

2020
Studies of Bias Temperature Instabilities in 4H-SiC DMOSFETs.
Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

2013
Building-in reliability in BCD (Bipolar-CMOS-DMOS) technologies.
Proceedings of the IEEE 10th International Conference on ASIC, 2013


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