Tom Munns

According to our database, Tom Munns authored at least 3 papers between 1991 and 2002.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2002

valuating ATE Features in Terms of Test Escape Rates and Other Cost of Test Culprits.

John Gatej, Lee Song, Carol Pyron, Rajesh Raina, Tom Munns

Proceedings of the Proceedings IEEE International Test Conference 2002, 2002

1993

Case study of 1149.01 microprocessor implementations.

William C. Bruce, Michael G. Gallup, Grady Giles, Tom Munns

Microprocess. Microsystems, 1993

1991

Implementing 1149.1 on CMOS Microprocessors.

William C. Bruce, Michael G. Gallup, Grady Giles, Tom Munns

Proceedings of the Proceedings IEEE International Test Conference 1991, 1991