Grady Giles

According to our database1, Grady Giles authored at least 18 papers between 1985 and 2017.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

Legend:

Book 
In proceedings 
Article 
PhD thesis 
Dataset
Other 

Links

On csauthors.net:

Bibliography

2017
Maximizing scan pin and bandwidth utilization with a scan routing fabric.
Proceedings of the IEEE International Test Conference, 2017

2016
Toward more efficient scan data bandwidth utilization on modern SOCs.
Proceedings of the 29th IEEE International System-on-Chip Conference, 2016

2015
Scan Test Bandwidth Management for Ultralarge-Scale System-on-Chip Architectures.
IEEE Trans. Very Large Scale Integr. Syst., 2015

2013
EDT bandwidth management - Practical scenarios for large SoC designs.
Proceedings of the 2013 IEEE International Test Conference, 2013

2010
The scan-DFT features of AMD's next-generation microprocessor core.
Proceedings of the 2011 IEEE International Test Conference, 2010

2009
Test Access Mechanism in the Quad-Core AMD Opteron Microprocessor.
IEEE Des. Test Comput., 2009

2008
The Test Features of the Quad-Core AMD Opteron- Microprocessor.
Proceedings of the 2008 IEEE International Test Conference, 2008

Test Access Mechanism for Multiple Identical Cores.
Proceedings of the 2008 IEEE International Test Conference, 2008

2005
Built-in constraint resolution.
Proceedings of the Proceedings 2005 IEEE International Test Conference, 2005

2002
Is Scan (Alone) Sufficient to Test Today?s Microprocessors? Not Quite, but We Can?t Get the Job Done Without It.
Proceedings of the Proceedings IEEE International Test Conference 2002, 2002

2000
Conversion of small functional test sets of nonscan blocks to scan patterns.
Proceedings of the Proceedings IEEE International Test Conference 2000, 2000

1998
Test Development for Second-Generation ColdFire Microprocessors.
IEEE Des. Test Comput., 1998

1997
A Case Study of the Test Development for the 2nd Generation ColdFire® Microprocessors.
Proceedings of the Proceedings IEEE International Test Conference 1997, 1997

1993
Case study of 1149.01 microprocessor implementations.
Microprocess. Microsystems, 1993

1991
Implementing 1149.1 on CMOS Microprocessors.
Proceedings of the Proceedings IEEE International Test Conference 1991, 1991

1990
Testability considerations in the design of the MC68340 Integrated Processor Unit.
Proceedings of the Proceedings IEEE International Test Conference 1990, 1990

1986
Testability Features of the MC68851 PMMU.
Proceedings of the Proceedings International Test Conference 1986, 1986

1985
A Methodology for Testing Content Addressable Memories.
Proceedings of the Proceedings International Test Conference 1985, 1985


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