Tony Balistreri

According to our database1, Tony Balistreri authored at least 2 papers in 2009.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of five.

Timeline

Legend:

Book 
In proceedings 
Article 
PhD thesis 
Dataset
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Links

On csauthors.net:

Bibliography

2009
Physical degradation of GaN HEMT devices under high drain bias reliability testing.
Microelectron. Reliab., 2009

A Wideband Power Amplifier MMIC Utilizing GaN on SiC HEMT Technology.
IEEE J. Solid State Circuits, 2009


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