Toshio Ikeda

According to our database1, Toshio Ikeda authored at least 4 papers between 2001 and 2004.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of five.

Timeline

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PhD thesis 
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Links

On csauthors.net:

Bibliography

2004
Technique to Diagnose Open Defects that Takes Coupling Effects into Consideration.
IEICE Trans. Inf. Syst., 2004

2002
A Persistent Diagnostic Technique for Unstable Defects.
Proceedings of the Proceedings IEEE International Test Conference 2002, 2002

2001
An evaluation of defect-oriented test: WELL-controlled low voltage test.
Proceedings of the Proceedings IEEE International Test Conference 2001, Baltimore, MD, USA, 30 October, 2001

An Approach to Improve the Resolution of Defect-Based Diagnosis.
Proceedings of the 10th Asian Test Symposium (ATS 2001), 19-21 November 2001, Kyoto, Japan, 2001


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