Kazuhiko Iwasaki

According to our database1, Kazuhiko Iwasaki authored at least 60 papers between 1986 and 2018.

Collaborative distances:
  • Dijkstra number2 of four.
  • Erdős number3 of four.

Timeline

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Bibliography

2018
Layout-Aware Fast Bridge/Open Test Generation by 2-Step Pattern Reordering.
IEICE Trans. Fundam. Electron. Commun. Comput. Sci., 2018

2017
Reordering-Based Test Pattern Reduction Considering Critical Area-Aware Weighted Fault Coverage.
IEICE Trans. Fundam. Electron. Commun. Comput. Sci., 2017

Layout-aware 2-step window-based pattern reordering for fast bridge/open test generation.
Proceedings of the IEEE International Test Conference, 2017

2016
Critical-Area-Aware Test Pattern Generation and Reordering.
Proceedings of the 25th IEEE Asian Test Symposium, 2016

2015
Note on Fast Bridge Fault Test Generation Based on Critical Area.
Proceedings of the Algorithms and Architectures for Parallel Processing, 2015

2013
Checkpoint Time Arrangement Rotation in Hybrid State Saving with a Limited Number of Periodical Checkpoints.
IEICE Trans. Inf. Syst., 2013

Classification of DNS Queries for Anomaly Detection.
Proceedings of the IEEE 19th Pacific Rim International Symposium on Dependable Computing, 2013

2012
Note on Layout-Aware Weighted Probabilistic Bridge Fault Coverage.
Proceedings of the 21st IEEE Asian Test Symposium, 2012

2011
Area-Per-Yield and Defect Level of Cascaded TMR for Pipelined Processors.
Proceedings of the 17th IEEE Pacific Rim International Symposium on Dependable Computing, 2011

2010
Reduction of Test Data Volume and Improvement of Diagnosability Using Hybrid Compression.
IEICE Trans. Inf. Syst., 2010

Reduction of Area per Good Die for SoC Memory Built-In Self-Test.
IEICE Trans. Fundam. Electron. Commun. Comput. Sci., 2010

A Distributed Data Replication Protocol for File Versioning with Optimal Node Assignments.
Proceedings of the 16th IEEE Pacific Rim International Symposium on Dependable Computing, 2010

2009
Automatic Handling of Programmable On-Product Clock Generation (OPCG) Circuitry for Low Power Aware Delay Test.
J. Low Power Electron., 2009

Small Delay Fault Model for Intra-Gate Resistive Open Defects.
Proceedings of the 27th IEEE VLSI Test Symposium, 2009

2008
Tester Structure Expression Language and Its Application to the Environment for VLSI Tester Program Development.
J. Inf. Process. Syst., 2008

Analysis of Probabilistic Trapezoid Protocol for Data Replication.
J. Inf. Process., 2008

Test Data Compression for Scan-Based BIST Aiming at 100x Compression Rate.
IEICE Trans. Inf. Syst., 2008

Study on Test Data Reduction Combining Illinois Scan and Bit Flipping.
IEICE Trans. Inf. Syst., 2008

Study on Expansion of Convolutional Compactors over Galois Field.
IEICE Trans. Inf. Syst., 2008

Hardware Overhead Reduction for Memory BIST.
Proceedings of the 2008 IEEE International Test Conference, 2008

2006
Analytical Model on Hybrid State Saving with a Limited Number of Checkpoints and Bound Rollbacks.
IEICE Trans. Fundam. Electron. Commun. Comput. Sci., 2006

Extension of coefficients for (n, k, m) convolutional-code-based packet loss recovery.
Comput. Math. Appl., 2006

Test Data Compression of 100x for Scan-Based BIST.
Proceedings of the 2006 IEEE International Test Conference, 2006

Expansion of Convolutional Compactors over Galois Field.
Proceedings of the 15th Asian Test Symposium, 2006

2005
Reliability Analysis of a Convolutional-Code-Based Packet Level FEC under Limited Buffer Size.
IEICE Trans. Fundam. Electron. Commun. Comput. Sci., 2005

Analysis of error-masking and X-masking probabilities for convolutional compactors.
Proceedings of the Proceedings 2005 IEEE International Test Conference, 2005

2004
Technique to Diagnose Open Defects that Takes Coupling Effects into Consideration.
IEICE Trans. Inf. Syst., 2004

Application of Partially Rotational Scan Technique with Tester IP for Processor Circuits.
IEICE Trans. Inf. Syst., 2004

Analysis of Read and Write Availability for Generalized Hybrid Data Replication Protocol.
Proceedings of the 10th IEEE Pacific Rim International Symposium on Dependable Computing (PRDC 2004), 2004

Finding a Recovery Line in Uncoordinated Checkpointing.
Proceedings of the 24th International Conference on Distributed Computing Systems Workshops (ICDCS 2004 Workshops), 2004

Seed Selection Procedure for LFSR-Based BIST with Multiple Scan Chains and Phase Shifters.
Proceedings of the 13th Asian Test Symposium (ATS 2004), 2004

2003
BIST-oriented test pattern generator for detection of transition faults.
Syst. Comput. Jpn., 2003

Seed Selection Procedure for LFSR-Based Random Pattern Generators.
IEICE Trans. Fundam. Electron. Commun. Comput. Sci., 2003

Implementation of Memory Tester Consisting of SRAM-Based Reconfigurable Cells.
Proceedings of the 12th Asian Test Symposium (ATS 2003), 17-19 November 2003, Xian, China, 2003

2002
Evaluation of Convolutional-Code-Based FEC under Limited Recovery Time and Its Application to Real-time Transmission.
Proceedings of the 9th Pacific Rim International Symposium on Dependable Computing (PRDC 2002), 2002

Adaptive Checkpointing for Time Warp Technique with a Limited Number of Checkpoints.
Proceedings of the 22nd International Conference on Distributed Computing Systems, 2002

Experiment for High-Assurance Video Conference System over the Internet.
Proceedings of the 7th IEEE International Symposium on High-Assurance Systems Engineering (HASE 2002), 2002

2001
Using ATPG vectors for BIST test pattern generator.
Syst. Comput. Jpn., 2001

Analysis of Using Convolutional Codes to Recover Packet Losses over Burst Erasure Channels.
Proceedings of the 8th Pacific Rim International Symposium on Dependable Computing (PRDC 2001), 2001

Hybrid BIST Using Partially Rotational Scan.
Proceedings of the 10th Asian Test Symposium (ATS 2001), 19-21 November 2001, Kyoto, Japan, 2001

2000
Evaluation of multicast error recovery using convolutional codes.
Proceedings of the 2000 Pacific Rim International Symposium on Dependable Computing (PRDC 2000), 2000

Method to Recover Internet Packet Losses Using (n, n - 1, m) Convolutional Codes.
Proceedings of the 2000 International Conference on Dependable Systems and Networks (DSN 2000) (formerly FTCS-30 and DCCA-8), 2000

1999
Measurement and Modeling of Burst Packet Losses in Internet End-to-End Communications.
Proceedings of the 1999 Pacific Rim International Symposium on Dependable Computing (PRDC 1999), 1999

1997
Experimental fault analysis of 1 Mb SRAM chips.
Proceedings of the 15th IEEE VLSI Test Symposium (VTS'97), 1997

1996
Aliasing Error for a Mask ROM Built-In Self-Test.
IEEE Trans. Computers, 1996

1995
On the Maximum Value of Aliasing Probabilities for Single Input Signature Registers.
IEEE Trans. Computers, 1995

1994
A Concurrent Test Architecture for Massively Parallel Computers and Its Error Detection Capability.
IEEE Trans. Parallel Distributed Syst., 1994

Aliasing error for a mask ROM built-in self-test.
Proceedings of the 12th IEEE VLSI Test Symposium (VTS'94), 1994

1993
A Note on Aliasing Probability for Multiple Input Signature Analyzer.
IEEE Trans. Computers, 1993

A uniform network for VLSI massively parallel computers.
Syst. Comput. Jpn., 1993

1992
Experimental results on the error detection capability of a concurrent test architecture for massively-parallel computers.
Parallel Comput., 1992

A defect-tolerant design for mask ROMs.
Proceedings of the 10th IEEE VLSI Test Symposium (VTS'92), 1992

1990
An analysis of the aliasing probability of multiple-input signature registers in the case of a 2<sup>m</sup>-ary symmetric channel.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1990

Analysis of Fault Detection Probability of CMOS Combinational Circuits and Its Application to Signature Testing.
Syst. Comput. Jpn., 1990

Design of signature circuits based on weight distributions of error-correcting codes.
Proceedings of the Proceedings IEEE International Test Conference 1990, 1990

1989
Aliasing Probabilities and Weight Distributions of Several Codes.
Syst. Comput. Jpn., 1989

1988
Analysis and proposal of signature circuits for LSI testing.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1988

Cache-based pipeline architecture in the Hitachi H32/200 32-bit microprocessor.
Proceedings of the Computer Design: VLSI in Computers and Processors, 1988

1987
Decoding method for shortened fire codes and its application to VLSI processor.
Syst. Comput. Jpn., 1987

1986
Analysis of error-detecting probability of signature circuit for lsi self-testing and proprosal of new signature circuit.
Syst. Comput. Jpn., 1986


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