Tzung-Yu Wu

According to our database1, Tzung-Yu Wu authored at least 1 paper in 2017.

Collaborative distances:
  • Dijkstra number2 of six.
  • Erdős number3 of five.

Timeline

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Links

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Bibliography

2017
Improved reliability characteristics of Ge MOS devices by capping Hf or Zr on interfacial layer.
Microelectron. Reliab., 2017


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