V. Born

According to our database, V. Born authored at least 1 paper in 2009.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2009

Extended metallization reliability testing: Combining standard wafer level with product tests to increase test sensitivity.

V. Born, M. Beck, O. Bosholm, D. Dalleau, S. Glenz, I. Haverkamp, G. Kurz, F. Lange, Anja Vest

Microelectron. Reliab., 2009