G. Kurz

According to our database, G. Kurz authored at least 2 papers between 2009 and 2014.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2014

HTOL SRAM Vmin shift considerations in scaled HKMG technologies.

S. Balasubramanian, Vivek Joshi, Torsten Klick, Randy W. Mann, Joseph Versaggi, Akhilesh Gautam, C. Weintraub, G. Kurz, G. Krause, Andreas Kerber, Biju Parameshwaran, Tanya Nigam

Proceedings of the IEEE 2014 Custom Integrated Circuits Conference, 2014

2009

Extended metallization reliability testing: Combining standard wafer level with product tests to increase test sensitivity.

V. Born, M. Beck, O. Bosholm, D. Dalleau, S. Glenz, I. Haverkamp, G. Kurz, F. Lange, Anja Vest

Microelectron. Reliab., 2009