Valentina Andreeva

Orcid: 0000-0003-1691-3448

According to our database1, Valentina Andreeva authored at least 13 papers between 2002 and 2022.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of five.

Timeline

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PhD thesis 
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Bibliography

2022
Deriving FSM-based tests using $a, b-\text{faults}$ for Logic Circuits.
Proceedings of the IEEE Computer Society Annual Symposium on VLSI, 2022

2021
SAT Solvers Application of Deriving All Test Pairs Detecting Robust Testable PDFs.
Proceedings of the IEEE East-West Design & Test Symposium, 2021

2019
Deriving Low Power Test Sequences Detecting Robust Testable PDFs.
Proceedings of the 2019 IEEE East-West Design & Test Symposium, 2019

2018
Fault-Tolerant Synchronous FSM Network Design for Path Delay Faults.
Proceedings of the 2018 IEEE East-West Design & Test Symposium, 2018

2017
Finding the shortest transfer sequence of sequential circuit based on simplified ROBDDs.
Proceedings of the 2017 IEEE East-West Design & Test Symposium, 2017

2016
ROBDDs application for finding the shortest transfer sequence of sequential circuit or only revealing existence of this sequence without deriving the sequence itself.
Proceedings of the 2016 IEEE East-West Design & Test Symposium, 2016

Patching circuit design based on reserved CLBs.
Proceedings of the IEEE International Conference on Automation, 2016

2015
Fully delay and multiple stuck-at faults testable FSM design.
Proceedings of the 2015 IEEE East-West Design & Test Symposium, 2015

2014
Decomposition tree - based compaction procedure with iteration steps for interconversional layouts of tasks.
Proceedings of the 2014 East-West Design & Test Symposium, 2014

2013
A research of heuristic optimization approaches to the test set compaction procedure based on a decomposition tree for combinational circuits.
Proceedings of the East-West Design & Test Symposium, 2013

2011
Test set compaction procedure for combinational circuits based on decomposition tree.
Proceedings of the 9th East-West Design & Test Symposium, 2011

2010
Test minimization technique for multiple stuck-at faults of combinational circuit.
Proceedings of the 2010 East-West Design & Test Symposium, 2010

2002
Survivable Discrete Circuits Design.
Proceedings of the 8th IEEE International On-Line Testing Workshop (IOLTW 2002), 2002


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