Victor Zieren

According to our database, Victor Zieren authored at least 2 papers between 1998 and 1999.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

1999

Transient current testing of 0.25 μm CMOS devices.

Bram Kruseman, Peter Janssen, Victor Zieren

Proceedings of the Proceedings IEEE International Test Conference 1999, 1999

1998

Defect detection with transient current testing and its potential for deep sub-micron CMOS ICs.

Manoj Sachdev, Peter Janssen, Victor Zieren

Proceedings of the Proceedings IEEE International Test Conference 1998, 1998