Viktor N. Ulimov

According to our database, Viktor N. Ulimov authored at least 5 papers between 2002 and 2018.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of six.

2018

Impact of elevated temperature applied during low dose rate irradiation on the degradation of BiCMOS operational amplifiers.

Aleksandr S. Petrov, Konstantin I. Tapero, Viktor N. Ulimov, A. M. Chlenov

Microelectron. Reliab., 2018

2017

True dose rate physical mechanism of ELDRS effect in bipolar devices.

V. S. Pershenkov, Aleksandr S. Petrov, Alexander S. Bakerenkov, Viktor N. Ulimov, V. A. Felytsyn, A. S. Rodin, V. V. Belyakov, V. A. Telets, V. V. Shurenkov

Microelectron. Reliab., 2017

2014

Influence of temperature and dose rate on the degradation of BiCMOS operational amplifiers during total ionizing dose testing.

Aleksandr S. Petrov, Konstantin I. Tapero, Viktor N. Ulimov

Microelectron. Reliab., 2014

2012

Some features of degradation in bipolar transistors at different test conditions for total ionizing dose effect.

Aleksandr S. Petrov, Viktor N. Ulimov

Microelectron. Reliab., 2012

2002

Use of preliminary ultraviolet and infrared illumination for diagnostics of MOS and bipolar devices radiation response.

V. S. Pershenkov, S. V. Avdeev, A. S. Tsimbalov, M. N. Levin, V. V. Belyakov, D. V. Ivashin, A. Y. Slesarev, A. Y. Bashin, Gennady I. Zebrev, Viktor N. Ulimov

Microelectron. Reliab., 2002