W. Dauksher

According to our database1, W. Dauksher authored at least 2 papers between 2003 and 2006.

Collaborative distances:
  • Dijkstra number2 of six.
  • Erdős number3 of six.

Timeline

Legend:

Book 
In proceedings 
Article 
PhD thesis 
Dataset
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Links

On csauthors.net:

Bibliography

2006
A methodology for the calculation of stress migration in die-level interconnects.
Microelectron. Reliab., 2006

2003
An examination of the applicability of the DNP metric on first level reliability assessments in underfilled electronic packages.
Microelectron. Reliab., 2003


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