Wan-Chan Hu

According to our database, Wan-Chan Hu authored at least 2 papers between 2010 and 2011.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2011

Partial state monitoring for fault detection estimation.

Yiwen Shi, Kantapon Kaewtip, Wan-Chan Hu, Jennifer Dworak

Proceedings of the 2011 IEEE International Test Conference, 2011

2010

Too many faults, too little time on creating test sets for enhanced detection of highly critical faults and defects.

Yiwen Shi, Wan-Chan Hu, Jennifer Dworak

Proceedings of the 28th IEEE VLSI Test Symposium, 2010