Wanchun Shi

According to our database1, Wanchun Shi authored at least 5 papers between 1994 and 1999.

Collaborative distances:
  • Dijkstra number2 of seven.
  • Erdős number3 of six.

Timeline

Legend:

Book 
In proceedings 
Article 
PhD thesis 
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Links

On csauthors.net:

Bibliography

1999
Intelligent Analysis and Off-Line Debugging of VLSI Device Test Programs.
J. Electron. Test., 1999

1997
OLDEVDTP: A Novel Environment for Off-Line Debugging of VLSI Device Test Programs.
Proceedings of the Proceedings IEEE International Test Conference 1997, 1997

1996
A Novel Approach to the Analysis of VLSI Device Test Programs.
Proceedings of the Proceedings IEEE International Test Conference 1996, 1996

1995
ICTSSE: An object-oriented IC test software supporting environment.
J. Comput. Sci. Technol., 1995

1994
An Intelligent Software-Integrated Environment of IC Testing.
Proceedings of the Proceedings IEEE International Test Conference 1994, 1994


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