Wen Lea Pearn

According to our database1, Wen Lea Pearn authored at least 73 papers between 1987 and 2023.

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Bibliography

2023
Improved profit model for production of MicroLED PCB with asymmetric specifications.
J. Oper. Res. Soc., January, 2023

2021
An improved measure of quality loss for notching processes.
Qual. Reliab. Eng. Int., 2021

2019
A note on Group Selection with multiple quality characteristics: power comparison of two methods.
Int. J. Prod. Res., 2019

2018
Power analysis for group supplier selection with multiple production lines.
Qual. Reliab. Eng. Int., 2018

2017
Dynamic operating policy for the controllable queue with two removable unreliable servers.
Int. J. Comput. Math. Comput. Syst. Theory, 2017

Lower confidence bounds as precision measure for truncated processes.
Commun. Stat. Simul. Comput., 2017

2016
An enhanced model for the integrated production and transportation problem in a multiple vehicles environment.
Soft Comput., 2016

2015
Product mix determination and capacity allocation for heterogeneous products in thin film transistor liquid crystal display manufacturing.
Comput. Ind. Eng., 2015

2014
Product Acceptance Determination for Processes with Multiple Independent Lines.
Qual. Reliab. Eng. Int., 2014

2013
Yield-Related Process Capability Indices for Processes of Multiple Quality Characteristics.
Qual. Reliab. Eng. Int., 2013

A Note on "Capability Assessment for Processes with Multiple Characteristics: A Generalization of the Popular Index <i>C</i><sub>pk</sub>".
Qual. Reliab. Eng. Int., 2013

An Extension of the Product Acceptance Determination for One-Sided Process with Multiple Characteristics.
Qual. Reliab. Eng. Int., 2013

Supplier Selection Critical Decision Values for Processes with Multiple Independent Lines.
Qual. Reliab. Eng. Int., 2013

A Close Form Solution for the Product Acceptance Determination Based on the Popular Index <i>C<sub>pk</sub></i>.
Qual. Reliab. Eng. Int., 2013

Measuring PPM Non-conformities for Processes with Asymmetric Tolerances.
Qual. Reliab. Eng. Int., 2013

Analysis of an infinite multi-server queue with an optional service.
Comput. Ind. Eng., 2013

2012
A batch arrival queue under randomised multi-vacation policy with unreliable server and repair.
Int. J. Syst. Sci., 2012

Production yield measure for multiple characteristics processes based on \({S_{pk}^T}\) under multiple samples.
Central Eur. J. Oper. Res., 2012

2011
Capability assessment for processes with multiple characteristics: A generalization of the popular index <i>C</i><sub><i>pk</i></sub>.
Qual. Reliab. Eng. Int., 2011

Multi-server retrial queue with second optional service: algorithmic computation and optimisation.
Int. J. Syst. Sci., 2011

Optimal management for infinite capacity <i>N</i>-policy M/G/1 queue with a removable service station.
Int. J. Syst. Sci., 2011

Comparative analysis of a randomized N-policy queue: An improved maximum entropy method.
Expert Syst. Appl., 2011

Decision-making in a single-period inventory environment with fuzzy demand.
Expert Syst. Appl., 2011

Optimal production run time for two-stage production system with imperfect processes and allowable shortages.
Central Eur. J. Oper. Res., 2011

The performance measures and randomized optimization for an unreliable server M<sup>[x]</sup>/G/1 vacation system.
Appl. Math. Comput., 2011

2010
Process selection for higher production yield based on capability index <i>S</i><sub><i>pk</i></sub>.
Qual. Reliab. Eng. Int., 2010

Comparison of two randomized policy M/G/1 queues with second optional service, server breakdown and startup.
J. Comput. Appl. Math., 2010

2009
Fast and effective algorithms for the liquid crystal display module (LCM) scheduling problem with sequence-dependent setup time.
J. Oper. Res. Soc., 2009

Supplier selection for one-sided processes with unequal sample sizes.
Eur. J. Oper. Res., 2009

Sample size determination for production yield estimation with multiple independent process characteristics.
Eur. J. Oper. Res., 2009

An Improved Approach for Estimating Product Performance Based on the Capability Index <i>C</i><sub><i>pmk</i></sub>.
Commun. Stat. Simul. Comput., 2009

2008
Solution strategies for multi-stage wafer probing scheduling problem with reentry.
J. Oper. Res. Soc., 2008

A variables sampling plan based on C.
Eur. J. Oper. Res., 2008

Capability adjustment for gamma processes with mean shift consideration in implementing Six Sigma program.
Eur. J. Oper. Res., 2008

2007
Measuring process capability based on <i>C</i><sub><i>pmk</i></sub> with gauge measurement errors.
Qual. Reliab. Eng. Int., 2007

Testing process precision for truncated normal distributions.
Microelectron. Reliab., 2007

Tool replacement policy for one-sided processes with low fraction defective.
J. Oper. Res. Soc., 2007

Optimal tool replacement for processes with low fraction defective.
Eur. J. Oper. Res., 2007

Accuracy Analysis of the Percentile Method for Estimating Non Normal Manufacturing Quality.
Commun. Stat. Simul. Comput., 2007

On the Sampling Distributions of the Estimated Process Loss Indices with Asymmetric Tolerances.
Commun. Stat. Simul. Comput., 2007

2006
Encyclopedia and Handbook of Process Capability Indices - A Comprehensive Exposition of Quality Control Measures
Series on Quality, Reliability and Engineering Statistics 12, WorldScientific, ISBN: 978-981-4478-11-3, 2006

One-sided Process Capability Assessment in the Presence of Measurement Errors.
Qual. Reliab. Eng. Int., 2006

Variables sampling plans with PPM fraction of defectives and process loss consideration.
J. Oper. Res. Soc., 2006

Multiple-process performance analysis chart based on process loss indices.
Int. J. Syst. Sci., 2006

Production quality and yield assurance for processes with multiple independent characteristics.
Eur. J. Oper. Res., 2006

2005
Measuring process capability based on C<sub>PK</sub> with gauge measurement errors.
Microelectron. Reliab., 2005

Cost benefit analysis of series systems with warm standby components and general repair time.
Math. Methods Oper. Res., 2005

Approximate solutions for the maximum benefit chinese postman problem.
Int. J. Syst. Sci., 2005

A Bayesian approach for assessing process precision based on multiple samples.
Eur. J. Oper. Res., 2005

Maximum entropy analysis to the N policy M/G/1 queueing system with server breakdowns and general startup times.
Appl. Math. Comput., 2005

2004
Algorithms for the wafer probing scheduling problem with sequence-dependent set-up time and due date restrictions.
J. Oper. Res. Soc., 2004

Optimal management of the <i>N</i>-policy <i>M</i>/<i>E</i><sub><i>k</i></sub>/1 queuing system with a removable service station: a sensitivity investigation.
Comput. Oper. Res., 2004

Testing process performance based on capability index C<sub>pk</sub> with critical values.
Comput. Ind. Eng., 2004

Sensitivity analysis of the optimal management policy for a queuing system with a removable and non-reliable server.
Comput. Ind. Eng., 2004

2003
Erratum to "An algorithm for calculating the lower confidence bounds of C<sub>PU</sub> and C<sub>PL</sub> with application to low-drop-out linear regulators" [Microelectronics Reliability 2003;43: 495-502].
Microelectron. Reliab., 2003

Manufacturing capability control for multiple power-distribution switch processes based on modified C<sub>pk</sub> MPPAC.
Microelectron. Reliab., 2003

An algorithm for calculating the lower confidence bounds of C<sub>PU</sub> and C<sub>PL</sub> with application to low-drop-out linear regulators.
Microelectron. Reliab., 2003

A reliable procedure for testing linear regulators with one-sided specification limits based on multiple samples.
Microelectron. Reliab., 2003

Cost benefit analysis of series systems with warm standby components.
Math. Methods Oper. Res., 2003

2002
A multiprocess performance analysis chart based on the incapability index C<sub>pp</sub>: an application to the chip resistors.
Microelectron. Reliab., 2002

Testing process capability for one-sided specification limit with application to the voltage level translator.
Microelectron. Reliab., 2002

Testing process performance based on the yield: an application to the liquid-crystal display module.
Microelectron. Reliab., 2002

The wafer probing scheduling problem (WPSP).
J. Oper. Res. Soc., 2002

1999
Improved solutions for the Chinese postman problem on mixed networks.
Comput. Oper. Res., 1999

1998
Improved solutions for the traveling purchaser problem.
Comput. Oper. Res., 1998

1995
Algorithms for the rural postman problem.
Comput. Oper. Res., 1995

Algorithms for the Chinese postman problem on mixed networks.
Comput. Oper. Res., 1995

1994
Solvable cases of the k-person Chinese postman problem.
Oper. Res. Lett., 1994

Algorithms for the Windy Postman Problem.
Comput. Oper. Res., 1994

1991
Augment-insert algorithms for the capacitated arc routing problem.
Comput. Oper. Res., 1991

1989
Approximate solutions for the capacitated arc routing problem.
Comput. Oper. Res., 1989

1988
New lower bounds for the Capacitated Arc Routing Problem.
Networks, 1988

1987
Transforming arc routing into node routing problems.
Comput. Oper. Res., 1987


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