Wern-Yih Duh

According to our database, Wern-Yih Duh authored at least 1 paper in 1998.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

1998

On the Determination of Threshold Voltages for CMOS Gates to Facilitate Test Pattern Generation and Fault Simulation.

Kuen-Jong Lee, Jing-Jou Tang, Wern-Yih Duh

Proceedings of the 7th Asian Test Symposium (ATS '98), 2-4 December 1998, Singapore, 1998