Wilian Padilha

According to our database, Wilian Padilha authored at least 4 papers between 2025 and 2026.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2026

Estimating Process Variability in Radiation-Tolerant Circuits With a New Metric.

Elias de Almeida Ramos, Augusto Weber, Wilian Padilha, João Baptista dos Santos Martins, Ricardo Reis

IEEE Trans. Circuits Syst. I Regul. Pap., June, 2026

2025

Correlation Between Process Variability and Radiation Hardness in Digital Circuits.

Elias de Almeida Ramos, Augusto Weber, Wilian Padilha, Renan Carlos Gomes de Farias, João Baptista dos Santos Martins, Ricardo Reis

Proceedings of the 33rd IFIP/IEEE International Conference on Very Large Scale Integration, 2025

A New Metric for Estimating the Effects of Process Variability and Applications in Radiation-Tolerant Digital Circuits.

Elias de Almeida Ramos, Augusto Weber, Wilian Padilha, João B. Martins, Ricardo Reis

Proceedings of the 23rd IEEE Interregional NEWCAS Conference, 2025

A Deterministic Model for Random Telegraph Noise.

Elias de Almeida Ramos, Wilian Padilha, Augusto Weber, Fredy Morales, João B. Martins, Ricardo Reis

Proceedings of the 16th IEEE Latin America Symposium on Circuits and Systems, 2025