Xinlan Tang

According to our database, Xinlan Tang authored at least 1 paper in 2024.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2024

Balancing the Efficiency and Sensitivity of Defect Inspection of Non-Patterned Wafers with TDI-Based Dark-Field Scattering Microscopy.

Fei Yu, Min Xu, Junhua Wang, Xiangchao Zhang, Xinlan Tang

Sensors, March, 2024