Xuan Zuo

According to our database, Xuan Zuo authored at least 10 papers between 2016 and 2025.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2025

Learning to Shard: RL for Co-optimizing the Parallelism Degrees and Per-operator Sharding Dimensions in Distributed LLM Inference.

Ruokai Yin, Sattwik Deb Mishra, Xuan Zuo, Hokchhay Tann, Preyas Shah, Apala Guha

CoRR, September, 2025

2024

Preference-based experience sharing scheme for multi-agent reinforcement learning in multi-target environments.

Xuan Zuo, Pu Zhang, Hui-Yan Li, Zhun-Ga Liu

Evol. Syst., October, 2024

NALA: a Nesterov accelerated look-ahead optimizer for deep learning.

Xuan Zuo, Hui-Yan Li, Shan Gao, Pu Zhang, Wan-Ru Du

PeerJ Comput. Sci., 2024

2022

Finite-Time Adaptive Cooperative Fault-Tolerant Control for Multi-Agent System With Hybrid Actuator Faults.

Pu Zhang, Huifeng Xue, Shan Gao, Xuan Zuo, Jialong Zhang

IEEE Syst. J., 2022

Adaptive cooperative fault-tolerance tracking control for multi-agent system with hybrid actuator faults and multiple unknown control directions.

Pu Zhang, Huifeng Xue, Shan Gao, Xuan Zuo, Jialong Zhang

Expert Syst. Appl., 2022

2020

Aging-resilient SRAM design: an end-to-end framework.

Xuan Zuo, Sandeep K. Gupta

Proceedings of the 38th IEEE VLSI Test Symposium, 2020

2018

Empirical Analysis Agricultural Insurance Coverage Levels from Demand Perspective.

Xuan Zuo, Qiao Zhang, Fei Lin, Adnan Rayit

Proceedings of the 2nd International Conference on Computer Science and Application Engineering, 2018

2017

Asymmetric sizing: An effective design approach for SRAM cells against BTI aging.

Xuan Zuo, Sandeep K. Gupta

Proceedings of the 35th IEEE VLSI Test Symposium, 2017

Research on polymerization equivalent modeling in large - Scale photovoltaic power plant.

Fei Li, Fan Wu, Xing Zhang, Jizhong Xi, Xuan Zuo

Proceedings of the IECON 2017 - 43rd Annual Conference of the IEEE Industrial Electronics Society, Beijing, China, October 29, 2017

2016

Process variation oriented delay testing of SRAMs.

Xuan Zuo, Sandeep K. Gupta

Proceedings of the 34th IEEE VLSI Test Symposium, 2016