Yacoub M. El-Ziq
  According to our database1,
  Yacoub M. El-Ziq
  authored at least 12 papers
  between 1977 and 1992.
  
  
Collaborative distances:
Collaborative distances:
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Bibliography
  1992
    Proceedings of the Proceedings IEEE International Test Conference 1992, 1992
    
  
  1987
    Proceedings of the 24th ACM/IEEE Design Automation Conference. Miami Beach, FL, USA, June 28, 1987
    
  
  1984
Impact of Mixed-Mode Self Test on Life Cycle Cost of VLSI Based Design.
  
    Proceedings of the Proceedings International Test Conference 1984, 1984
    
  
  1983
A Mixed-Mode Built-In Self-Test Technique Using Scan Path and Signature Analysis.
  
    Proceedings of the Proceedings International Test Conference 1983, 1983
    
  
  1982
  1981
Functional-Level Test Generation for Stuck-Open Faults in CMOS VLSI.
  
    Proceedings of the Proceedings International Test Conference 1981, 1981
    
  
    Proceedings of the 18th Design Automation Conference, 1981
    
  
  1980
    Proceedings of the 17th Design Automation Conference, 1980
    
  
  1979
Testing of MOS combinational networks a procedure for efficient fault simulation and test generation.
    
  
    Proceedings of the 16th Design Automation Conference, 1979
    
  
  1978
Computer-Aided Logic Design of Two-Level MOS Combinational Networks with Statistical Results.
    
  
    IEEE Trans. Computers, 1978
    
  
Logic design automation of MOS combinational networks with fan-in, fan-out constraints.
    
  
    Proceedings of the 15th Design Automation Conference, 1978
    
  
  1977
    Proceedings of the 14th Design Automation Conference, 1977