Yasuo Nakagawa
  According to our database1,
  Yasuo Nakagawa
  authored at least 13 papers
  between 1979 and 2009.
  
  
Collaborative distances:
Collaborative distances:
Timeline
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Bibliography
  2009
Development of an Enterprise-Wide Yield Management System Using Critical Area Analysis for High-Product-Mix Semiconductor Manufacturing.
    
  
    IEICE Trans. Electron., 2009
    
  
  1994
    Proceedings of Second IEEE Workshop on Applications of Computer Vision, 1994
    
  
  1992
Development of Solder Joint Inspection Method Using Air Stimulation Speckle Vibration Detection Method and Fluorescence Detection Method.
    
  
    Proceedings of IAPR Workshop on Machine Vision Applications, 1992
    
  
Automatic screen-printed circuit pattern inspection using connectivity preserving image reduction and connectivity comparison.
    
  
    Proceedings of the 11th IAPR International Conference on Pattern Recognition, 1992
    
  
  1990
Precise Visual Inspection of LSI Wafer Patterns by Local Perturbation Pattern Matching Algorithm.
    
  
    Syst. Comput. Jpn., 1990
    
  
Automated visual inspection for lsi water multilayer patterns by cascade pattern matching algorithm.
    
  
    Syst. Comput. Jpn., 1990
    
  
Precise Position Detection of a Mesh-Backed Printing Screen Based on the Smallest Enclosing Circle Detection.
    
  
    Proceedings of IAPR Workshop on Machine Vision Applications, 1990
    
  
    Proceedings of the 1990 IEEE International Conference on Robotics and Automation, 1990
    
  
  1989
Automatic 2 1/2 D shape inspection system for via-hole fillings of green sheets by shadow image analysis.
    
  
    Proceedings of the 1989 IEEE International Conference on Robotics and Automation, 1989
    
  
  1988
Precise Visual Inspection Algorithm for LSI Wafer Patterns Using Grayscale Image Comparison.
    
  
    Proceedings of IAPR Workshop on Computer Vision, 1988
    
  
  1979
    Pattern Recognit., 1979