Yizhan Liu
According to our database1,
Yizhan Liu authored at least 2 papers
between 2025 and 2026.
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Bibliography
2026
EMaper: Cross-level Electromigration Aware Placement and Routing EDA Workflow for Interconnects Hotspot Prediction and Mitigation.
Proceedings of the Design, Automation & Test in Europe Conference, 2026
2025
Opposite Impact of Temperature Difference Direction on Electromigration Failure in N-type Versus P-type Metal.
Proceedings of the IEEE International Reliability Physics Symposium, 2025