Younghwan Son

According to our database1, Younghwan Son authored at least 3 papers between 2017 and 2025.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

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Links

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Bibliography

2025
Innovative V-NAND Flash Structure with Dual Trap Layer for Future Generations of Multi-Bit Device.
Proceedings of the IEEE International Memory Workshop, 2025

2017
Characterization of oxide trap density with the charge pumping technique in dual-layer gate oxide.
IEICE Electron. Express, 2017

Investigation of capture and emission dependence between individual traps from complex random telegraph signal noise analysis.
IEICE Electron. Express, 2017


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