Younghwan Son
According to our database1,
Younghwan Son
authored at least 3 papers
between 2017 and 2025.
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Bibliography
2025
Innovative V-NAND Flash Structure with Dual Trap Layer for Future Generations of Multi-Bit Device.
Proceedings of the IEEE International Memory Workshop, 2025
2017
Characterization of oxide trap density with the charge pumping technique in dual-layer gate oxide.
IEICE Electron. Express, 2017
Investigation of capture and emission dependence between individual traps from complex random telegraph signal noise analysis.
IEICE Electron. Express, 2017