Yu Haibo

According to our database, Yu Haibo authored at least 2 papers between 2012 and 2020.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2020

Reliability Evaluation of Smart Meters Under Degradation-Shock Loads Based on Phase-Type Distributions.

Dan Xu, Xiaoqi Xiao, Yu Haibo

IEEE Access, 2020

2012

Wafer level approaches for the integration of carbon nanotubes in electronic and sensor applications.

Sascha Hermann, Holger Fiedler, Yu Haibo, Sergei Loschek, Jens Bonitz, Stefan E. Schulz, Thomas Gessner

Proceedings of the International Multi-Conference on Systems, Signals & Devices, 2012