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Yuji Yamagishi

Orcid: 0000-0001-6269-2426

According to our database1, Yuji Yamagishi authored at least 3 papers between 2018 and 2019.

Collaborative distances:
  • Dijkstra number2 of six.
  • Erdős number3 of five.

Timeline

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Links

On csauthors.net:

Bibliography

2019
High Resolution Observation of Subsurface Defects at SiO2/4H-SiC Interfaces by Local Deep Level Transient Spectroscopy Based on Time-Resolved Scanning Nonlinear Dielectric Microscopy.
[BibTeX]
[DOI]
Yuji Yamagishi
,
Yasuo Cho
Proceedings of the IEEE International Reliability Physics Symposium, 2019

2018
High resolution observation of defects at SiO<sub>2</sub>/4H-SiC interfaces using time-resolved scanning nonlinear dielectric microscopy.
[BibTeX]
[DOI]
Yuji Yamagishi
,
Y. Cho
Microelectron. Reliab., 2018

Charge state evaluation of passivation layers for silicon solar cells by scanning nonlinear dielectric microscopy.
[BibTeX]
[DOI]
Kento Kakikawa
,
Yuji Yamagishi
,
Yasuo Cho
,
Katsuto Tanahashi
,
Hidetaka Takato
Proceedings of the IEEE International Reliability Physics Symposium, 2018


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