Yukio Okuda

According to our database, Yukio Okuda authored at least 6 papers between 1998 and 2007.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2007

Gate delay ratio model for unified path delay analysis.

Yukio Okuda

Proceedings of the 2007 IEEE International Test Conference, 2007

2004

Panel Synopsis - Diagnosis Meets Physical Failure Analysis: How Long Can We Succeed?

Yukio Okuda

Proceedings of the Proceedings 2004 International Test Conference (ITC 2004), 2004

2003

Hysteresis of Intrinsic IDDQ Currents.

Yukio Okuda, Nobuyuki Furukawa

Proceedings of the Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September, 2003

2002

Eigen-Signatures for Regularity-based IDDQ Testing.

Yukio Okuda

Proceedings of the 20th IEEE VLSI Test Symposium (VTS 2002), Without Testing It's a Gamble, 28 April, 2002

2000

DECOUPLE: defect current detection in deep submicron I_DDQ.

Yukio Okuda

Proceedings of the Proceedings IEEE International Test Conference 2000, 2000

1998

Defect level prediction for I_DDQ testing.

Yukio Okuda, Isao Kubota, Masahiro Watanabe

Proceedings of the Proceedings IEEE International Test Conference 1998, 1998