Yuwei Zhang

According to our database, Yuwei Zhang authored at least 13 papers between 2020 and 2025.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2025

SAGA: Summarization-Guided Assert Statement Generation.

Yuwei Zhang, Zhi Jin, Ze-Jun Wang, Ying Xing, Ge Li

J. Comput. Sci. Technol., January, 2025

CITYWALK: Enhancing LLM-Based C++ Unit Test Generation via Project-Dependency Awareness and Language-Specific Knowledge.

Yuwei Zhang, Qingyuan Lu, Kai Liu, Wensheng Dou, Jiaxin Zhu, Li Qian, Chunxi Zhang, Zheng Lin, Jun Wei

CoRR, January, 2025

PATCH: Empowering Large Language Model with Programmer-Intent Guidance and Collaborative-Behavior Simulation for Automatic Bug Fixing.

Yuwei Zhang, Zhi Jin, Ying Xing, Ge Li, Fang Liu, Jiaxin Zhu, Wensheng Dou, Jun Wei

CoRR, January, 2025

2024

Defect Category Prediction Based on Multi-Source Domain Adaptation.

Ying Xing, Mengci Zhao, Bin Yang, Yuwei Zhang, Wenjin Li, Jiawei Gu, Jun Yuan

CoRR, 2024

2023

STEAM: Simulating the InTeractive BEhavior of ProgrAMmers for Automatic Bug Fixing.

Yuwei Zhang, Zhi Jin, Ying Xing, Ge Li

CoRR, 2023

Automated Static Warning Identification via Path-based Semantic Representation.

Yuwei Zhang, Ying Xing, Ge Li, Zhi Jin

CoRR, 2023

SAGA: Summarization-Guided Assert Statement Generation.

Yuwei Zhang, Zhi Jin, Zejun Wang, Ying Xing, Ge Li

CoRR, 2023

Neural Program Repair with Program Dependence Analysis and Effective Filter Mechanism.

Yuwei Zhang, Ge Li, Zhi Jin, Ying Xing

CoRR, 2023

Vulnerability Name Prediction Based on Enhanced Multi-Source Domain Adaptation.

Ying Xing, Mengci Zhao, Bin Yang, Yuwei Zhang, Wenjin Li, Jiawei Gu, Jun Yuan, Lexi Xu

Proceedings of the 22nd IEEE International Conference on Trust, 2023

2022

Cross-project defect prediction based on G-LSTM model.

Ying Xing, Xiaomeng Qian, Yu Guan, Bin Yang, Yuwei Zhang

Pattern Recognit. Lett., 2022

ST-TLF: Cross-version defect prediction framework based transfer learning.

Yanyang Zhao, Yawen Wang, Yuwei Zhang, Dalin Zhang, Yunzhan Gong, Dahai Jin

Inf. Softw. Technol., 2022

2020

A variable-level automated defect identification model based on machine learning.

Yuwei Zhang, Ying Xing, Yunzhan Gong, Dahai Jin, Honghui Li, Feng Liu

Soft Comput., 2020

Automated defect identification via path analysis-based features with transfer learning.

Yuwei Zhang, Dahai Jin, Ying Xing, Yunzhan Gong

J. Syst. Softw., 2020