Zhongze He
Orcid: 0009-0008-5475-9289Timeline
Legend:
Book In proceedings Article PhD thesis Dataset OtherLinks
On csauthors.net:
Bibliography
2025
Physics-informed neural network supported wiener process for degradation modeling and reliability prediction.
Reliab. Eng. Syst. Saf., 2025
A nonparametric degradation modeling method based on generalized stochastic process with B-spline function and Kolmogorov hypothesis test considering distribution uncertainty.
Comput. Ind. Eng., 2025
A degradation modeling method based on artificial neural network supported Tweedie exponential dispersion process.
Adv. Eng. Informatics, 2025