A. Kerlain

According to our database1, A. Kerlain authored at least 2 papers between 2004 and 2005.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of five.

Timeline

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Links

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Bibliography

2005
Robust, versatile, direct low-frequency noise characterization method for material/process quality control using cross-shaped 4-terminal devices.
Microelectron. Reliab., 2005

2004
Long-term reliability of Ti-Pt-Au metallization system for Schottky contact and first-level metallization on SiC MESFET.
Microelectron. Reliab., 2004


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