A. Sozza

Orcid: 0000-0003-1135-152X

According to our database¹, A. Sozza authored at least 4 papers between 2004 and 2006.

Collaborative distances:

Dijkstra number² of five.
Erdős number³ of five.

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Bibliography

2006

AlGaN/GaN HEMT Reliability Assessment by means of Low Frequency Noise Measurements.

[BibT_eX]

[DOI]

Microelectron. Reliab., 2006

2005

A 3000 hours DC Life Test on AlGaN/GaN HEMT for RF and microwave applications.

[BibT_eX]

[DOI]

Microelectron. Reliab., 2005

2004

Reliability Investigation of Gallium Nitride HEMT.

[BibT_eX]

[DOI]

Microelectron. Reliab., 2004

Long-term reliability of Ti-Pt-Au metallization system for Schottky contact and first-level metallization on SiC MESFET.

[BibT_eX]

[DOI]

Microelectron. Reliab., 2004

A. Sozza

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