A. Petitqueux

According to our database1, A. Petitqueux authored at least 4 papers between 1999 and 2003.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

Legend:

Book 
In proceedings 
Article 
PhD thesis 
Dataset
Other 

Links

On csauthors.net:

Bibliography

2003
A Unified DFT Approach for BIST and External Test.
J. Electron. Test., 2003

2001
Generalized Distributed Comparison-Based System-Level Diagnosis.
Proceedings of the 2nd Latin American Test Workshop, 2001

2000
Design for sequential testability: an internal state reseeding approach for 100 % fault coverage.
Proceedings of the 9th Asian Test Symposium (ATS 2000), 4-6 December 2000, Taipei, Taiwan, 2000

1999
Partial set for flip-flops based on state requirement for non-scan BIST scheme.
Proceedings of the 4th European Test Workshop, 1999


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