A. Sasikumar

According to our database1, A. Sasikumar authored at least 4 papers between 2015 and 2016.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of five.

Timeline

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Links

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Bibliography

2016
Deep trap-induced dynamic on-resistance degradation in GaN-on-Si power MISHEMTs.
Microelectron. Reliab., 2016

Evidence for causality between GaN RF HEMT degradation and the E<sub>C</sub>-0.57 eV trap in GaN.
Microelectron. Reliab., 2016

2015
Identification of an RF degradation mechanism in GaN based HEMTs triggered by midgap traps.
Microelectron. Reliab., 2015

Proton irradiation-induced traps causing VT instabilities and RF degradation in GaN HEMTs.
Proceedings of the IEEE International Reliability Physics Symposium, 2015


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