Abdelmadjid Benabdelmoumene

Orcid: 0000-0003-4879-6274

According to our database1, Abdelmadjid Benabdelmoumene authored at least 8 papers between 2013 and 2020.

Collaborative distances:
  • Dijkstra number2 of six.
  • Erdős number3 of six.

Timeline

Legend:

Book 
In proceedings 
Article 
PhD thesis 
Dataset
Other 

Links

On csauthors.net:

Bibliography

2020
Sizing of the CMOS 6T-SRAM cell for NBTI ageing mitigation.
IET Circuits Devices Syst., 2020

2014
Investigation of interface, shallow and deep oxide traps under NBTI stress using charge pumping technique.
Microelectron. Reliab., 2014

An Accurate Combination of on-the-fly Interface Trap and Threshold Voltage Methods for NBTI Degradation Extraction.
J. Electron. Test., 2014

Investigation of defect microstructures responsible for NBTI degradation using effective dipole moment extraction.
Proceedings of the 9th International Design and Test Symposium, 2014

Reliability analysis of CMOS inverter subjected to AC & DC NBTI stresses.
Proceedings of the 9th International Design and Test Symposium, 2014

Reaction-diffusion model for interface traps induced by BTS stress including H<sup>+</sup>, H and H2 as diffusion species.
Proceedings of the 9th International Design and Test Symposium, 2014

Does NBTI effect in MOS transistors depend on channel length?
Proceedings of the 26th International Conference on Microelectronics, 2014

2013
A new procedure for eliminating the geometric component from charge pumping: Application for NBTI and radiation issues.
Microelectron. Reliab., 2013


  Loading...