Hakim Tahi

Orcid: 0000-0002-6191-1073

According to our database1, Hakim Tahi authored at least 8 papers between 2013 and 2015.

Collaborative distances:
  • Dijkstra number2 of six.
  • Erdős number3 of six.

Timeline

Legend:

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In proceedings 
Article 
PhD thesis 
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Links

On csauthors.net:

Bibliography

2015
Low magnetic field Impact on NBTI degradation.
Microelectron. Reliab., 2015

2014
Investigation of interface, shallow and deep oxide traps under NBTI stress using charge pumping technique.
Microelectron. Reliab., 2014

An Accurate Combination of on-the-fly Interface Trap and Threshold Voltage Methods for NBTI Degradation Extraction.
J. Electron. Test., 2014

Investigation of defect microstructures responsible for NBTI degradation using effective dipole moment extraction.
Proceedings of the 9th International Design and Test Symposium, 2014

Reliability analysis of CMOS inverter subjected to AC & DC NBTI stresses.
Proceedings of the 9th International Design and Test Symposium, 2014

Reaction-diffusion model for interface traps induced by BTS stress including H<sup>+</sup>, H and H2 as diffusion species.
Proceedings of the 9th International Design and Test Symposium, 2014

Does NBTI effect in MOS transistors depend on channel length?
Proceedings of the 26th International Conference on Microelectronics, 2014

2013
A new procedure for eliminating the geometric component from charge pumping: Application for NBTI and radiation issues.
Microelectron. Reliab., 2013


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