Ahmed Ibrahim

According to our database, Ahmed Ibrahim authored at least 13 papers between 2014 and 2024.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2024

Adaptive SAT Modeling for Optimal Pattern Retargeting in IEEE 1687 Networks.

Abrar A. Ibrahim, Ahmed M. Y. Ibrahim, M. Watheq El-Kharashi, Mona Safar

IEEE Trans. Computers, February, 2024

2023

Optimal Pattern Retargeting in IEEE 1687 Networks: A SAT-based Upper-Bound Computation.

Abrar A. Ibrahim, Ahmed M. Y. Ibrahim, M. Watheq El-Kharashi, Mona Safar

ACM Trans. Design Autom. Electr. Syst., July, 2023

2019

Efficient Structured Scan Patterns Retargeting for Hierarchical IEEE 1687 Networks.

Ahmed M. Y. Ibrahim, Hans G. Kerkhoff, Abrar Ibrahim, Mona Safar, M. Watheq El-Kharashi

Proceedings of the 37th IEEE VLSI Test Symposium, 2019

DARS: An EDA Framework for Reliability and Functional Safety Management of System-on-Chips.

Ahmed M. Y. Ibrahim, Hans G. Kerkhoff

Proceedings of the IEEE International Test Conference, 2019

An On-Chip IEEE 1687 Network Controller for Reliability and Functional Safety Management of System-on-Chips.

Ahmed M. Y. Ibrahim, Hans G. Kerkhoff

Proceedings of the IEEE International Test Conference in Asia, 2019

2017

Structured scan patterns retargeting for dynamic instruments access.

Ahmed Ibrahim, Hans G. Kerkhoff

Proceedings of the 35th IEEE VLSI Test Symposium, 2017

Applying IJTAG-compatible embedded instruments for lifetime enhancement of analog front-ends of cyber-physical systems.

Hans G. Kerkhoff, Ghazanfar Ali, Jinbo Wan, Ahmed Ibrahim, Jerrin Pathrose

Proceedings of the 2017 IFIP/IEEE International Conference on Very Large Scale Integration, 2017

An automotive MP-SoC featuring an advanced embedded instrument infrastructure for high dependability.

Hans G. Kerkhoff, Ghazanfar Ali, Hassan Ebrahimi, Ahmed Ibrahim

Proceedings of the International Test Conference in Asia, 2017

A cost-efficient dependability management framework for self-aware system-on-chips based on IEEE 1687.

Ahmed Ibrahim, Hans G. Kerkhoff

Proceedings of the 23rd IEEE International Symposium on On-Line Testing and Robust System Design, 2017

2016

Towards an automated and reusable in-field self-test solution for MPSoCs.

Ahmed Ibrahim, Hans G. Kerkhoff

Proceedings of the 28th International Conference on Microelectronics, 2016

Analysis and design of an on-chip retargeting engine for IEEE 1687 networks.

Ahmed Ibrahim, Hans G. Kerkhoff

Proceedings of the 21th IEEE European Test Symposium, 2016

Efficient utilization of hierarchical iJTAG networks for interrupts management.

Ahmed Ibrahim, Hans G. Kerkhoff

Proceedings of the 2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2016

2014

iJTAG integration of complex digital embedded instruments.

Ahmed Ibrahim, Hans G. Kerkhoff

Proceedings of the 9th International Design and Test Symposium, 2014