Ali Alaeddine

According to our database, Ali Alaeddine authored at least 9 papers between 2009 and 2017.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2017

OFDM signal up and down frequency conversions by a sampling method using a SOA-MZI.

Hassan Termos, Thierry Rampone, Ammar Sharaiha, Ali Hamie, Ali Alaeddine

Proceedings of the 29th International Conference on Microelectronics, 2017

2016

Pulse shape pre-distortion for improving the power efficiency of SOA-based IR-UWB over fiber systems.

Haidar Taki, Stéphane Azou, Ali Hamie, A. Al Housseini, Ali Alaeddine, Ammar Sharaiha

Proceedings of the 23rd International Conference on Telecommunications, 2016

A novel ultra high speed and configurable discrete wavelet packet transform architecture.

Mouhamad Chehaitly, Mohamed Tabaa, Fabrice Monteiro, Abbas Dandache, Ali Alaeddine, Ali Hamie, Mouenes Fadlallah

Proceedings of the 28th International Conference on Microelectronics, 2016

2015

On optimizing the operating conditions of a Mach-Zehnder modulator for IR-UWB over fiber transmission.

Haidar Taki, Stéphane Azou, Ali Hamie, A. Al Housseini, Ali Alaeddine, Ammar Sharaiha

Proceedings of the 2015 Fifth International Conference on Digital Information and Communication Technology and its Applications, 2015

2013

Experimental investigation of Zener diode reliability under pulsed Electrical Overstress (EOS).

Jian-Zhi Zhu, François Fouquet, Blaise Ravelo, Ali Alaeddine, Moncef Kadi

Microelectron. Reliab., 2013

Statistical analysis-based approach for check node processor inputs of NB-LDPC decoder.

Ali Chamas Al Ghouwayel, Abbass Nasser, Ali Alaeddine, Hussein Hijazi

Proceedings of the Third International Conference on Communications and Information Technology, 2013

Performance analysis of the Wavelet-OFDM new scheme in AWGN channel.

Alaa Ghaith, Rima Hatoum, Hiba Mrad, Ali Alaeddine

Proceedings of the Third International Conference on Communications and Information Technology, 2013

2010

Characteristics degradation of the SiGe HBT under electromagnetic field stress.

Ali Alaeddine, Moncef Kadi, Kaouther Daoud, B. Beydoun

Microelectron. Reliab., 2010

2009

Effects of electromagnetic near-field stress on SiGe HBT's reliability.

Ali Alaeddine, Moncef Kadi, Kaouther Daoud, B. Mazari

Microelectron. Reliab., 2009