Alvernon Walker

According to our database1, Alvernon Walker authored at least 12 papers between 1992 and 2022.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

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Bibliography

2022
Integrating Support Vector Machine Models into the Engineering Lifecycle Design Roadmap Process for Innovative Practices using Project Based Learning.
Proceedings of the IEEE Frontiers in Education Conference, 2022

Research-to-Practice for Peer-to-Peer Learning in Engineering Education using Ensemble Methods to Deploy a Lifecycle Design Roadmap.
Proceedings of the IEEE Frontiers in Education Conference, 2022

2001
A Fine Grain Configurable Logic Block for Self-checking FPGAs.
VLSI Design, 2001

A Step Response Based Mixed-Signal BIST Approach .
Proceedings of the 16th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2001), 2001

On-Line Error Detectable Carry-Free Adder Design.
Proceedings of the 16th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2001), 2001

A Unified Scheme for Designing Testable State Machines.
Proceedings of the 10th Asian Test Symposium (ATS 2001), 19-21 November 2001, Kyoto, Japan, 2001

2000
A Transition Based BIST Approach for Passive Analog Circuits.
Proceedings of the 1st International Symposium on Quality of Electronic Design (ISQED 2000), 2000

An On-Line Reconfigurable FPGA Architecture.
Proceedings of the 15th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2000), 2000

1999
A CMOS-Based Logic Cell for the Implementation of Self-Checking FPGAs.
Proceedings of the 14th International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT '99), 1999

1998
On Self-Checking Design of CMOS Circuits for Multiple Faults.
VLSI Design, 1998

1997
An approach for detecting bridging faults in CMOS domino logic circuits using dynamic power supply current monitoring.
Proceedings of the 1997 Workshop on Defect and Fault-Tolerance in VLSI Systems (DFT '97), 1997

1992
Fault Diagnosis in Analog Circuits Using Element Modulation.
IEEE Des. Test Comput., 1992


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