Amir Sajjad Bahman

According to our database, Amir Sajjad Bahman authored at least 13 papers between 2013 and 2024.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2024

Enhanced Single-Inductor Single-Input Dual-Output DC-DC Converter With Voltage Balancing Capability.

Babak Rooholahi, Yam Prasad Siwakoti, Hans-Guenter Eckel, Frede Blaabjerg, Amir Sajjad Bahman

IEEE Trans. Ind. Electron., 2024

2022

Improved Temperature Monitoring and Protection Method of Three-Level NPC Application Based on Half-Bridge IGBT Modules.

Qiang Wang, Jingwei Zhang, Francesco Iannuzzo, Amir Sajjad Bahman, Weifeng Zhang, Fengyou He

IEEE Access, 2022

2021

Effect of Current Distortion and Unbalanced Loads on Semiconductors Reliability.

Tomàs Lledó-Ponsati, Amir Sajjad Bahman, Francesco Iannuzzo, Daniel Montesinos-Miracle, Samuel Galceran-Arellano

IEEE Access, 2021

An Extended Multilayer Thermal Model for Multichip IGBT Modules Considering Thermal Aging.

Mohsen Akbari, Mohammad Tavakoli Bina, Amir Sajjad Bahman, Bahman Eskandari, Edris Pouresmaeil, Frede Blaabjerg

IEEE Access, 2021

A Review on IGBT Module Failure Modes and Lifetime Testing.

Ahmed Abuelnaga, Mehdi Narimani, Amir Sajjad Bahman

IEEE Access, 2021

2019

A Methodology for Rapid Estimation of Junction Temperature of Power Semiconductors Considering Mission Profiles.

Omid Alavi, Amir Sajjad Bahman

Proceedings of the 28th IEEE International Symposium on Industrial Electronics, 2019

2018

Failure mechanism analysis of fuses subjected to manufacturing and operational thermal stresses.

Amir Sajjad Bahman, S. M. Jensen, Francesco Iannuzzo

Microelectron. Reliab., 2018

Thermal modeling of wire-bonded power modules considering non-uniform temperature and electric current interactions.

Mohsen Akbari, Amir Sajjad Bahman, Paula Diaz Reigosa, Francesco Iannuzzo, Mohammad Tavakoli Bina

Microelectron. Reliab., 2018

2017

Reliability-oriented environmental thermal stress analysis of fuses in power electronics.

Amir Sajjad Bahman, Francesco Iannuzzo, T. Holmgaard, R. Ø. Nielsen, Frede Blaabjerg

Microelectron. Reliab., 2017

Compact electro-thermal modeling of a SiC MOSFET power module under short-circuit conditions.

Lorenzo Ceccarelli, Paula Diaz Reigosa, Amir Sajjad Bahman, Francesco Iannuzzo, Frede Blaabjerg

Proceedings of the IECON 2017 - 43rd Annual Conference of the IEEE Industrial Electronics Society, Beijing, China, October 29, 2017

2016

Mission-profile-based stress analysis of bond-wires in SiC power modules.

Amir Sajjad Bahman, Francesco Iannuzzo, Frede Blaabjerg

Microelectron. Reliab., 2016

2013

Comparison between 9-level hybrid asymmetric and conventional multi-level inverters for medium voltage application.

Amir Sajjad Bahman, Frede Blaabjerg

Proceedings of the 22nd IEEE International Symposium on Industrial Electronics, 2013

Evaluation of switch currents in nine-switch energy conversion systems.

Poh Chiang Loh, Amir Sajjad Bahman, Zian Qin, Frede Blaabjerg

Proceedings of the IECON 2013, 2013