Argon Chen

Orcid: 0000-0002-7951-9950

According to our database1, Argon Chen authored at least 14 papers between 2002 and 2022.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

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Links

On csauthors.net:

Bibliography

2022
Multivariate multi-layer classifier.
Pattern Recognit., 2022

2021
Binary multi-layer classifier.
Inf. Sci., 2021

Equipment deterioration modeling and cause diagnosis in semiconductor manufacturing.
Int. J. Intell. Syst., 2021

Many-to-many comprehensive relative importance analysis and its applications to analysis of semiconductor electrical testing parameters.
Adv. Eng. Informatics, 2021

2020
Comprehensive relative importance analysis and its applications to high dimensional gene expression data analysis.
Knowl. Based Syst., 2020

2019
Classification Tree with Hybrid Splitting Mechanism.
Proceedings of the 17th IEEE International Symposium on Intelligent Systems and Informatics, 2019

2018
Equipment Deterioration Modeling and Causes Diagnosis in Semiconductor Manufacturing.
Proceedings of the 14th IEEE International Conference on Automation Science and Engineering, 2018

2015
Applications of quantitative methods in semiconductor manufacturing.
Comput. Oper. Res., 2015

2014
A variance-reduction method for thyroid nodule boundary detection on ultrasound images.
Proceedings of the 2014 IEEE International Conference on Automation Science and Engineering, 2014

2012
Dominance index for many-to-many correlation and its applicaions to semiconductor yield analysis.
Proceedings of the Winter Simulation Conference, 2012

2011
Spatial Variance Spectrum Analysis and Its Application to Unsupervised Detection of Systematic Wafer Spatial Variations.
IEEE Trans Autom. Sci. Eng., 2011

2009
Optimum sampling for track PEB CD Integrated Metrology.
Proceedings of the IEEE Conference on Automation Science and Engineering, 2009

2008
Optimal sampling in design of experiment for simulation-based stochastic optimization.
Proceedings of the 2008 IEEE International Conference on Automation Science and Engineering, 2008

2002
Design and Performance Analysis of the Exponentially Weighted Moving Average Mean Estimate for Processes Subject to Random Step Changes.
Technometrics, 2002


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