Jakey Blue

According to our database, Jakey Blue authored at least 15 papers between 2009 and 2021.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2021

Equipment deterioration modeling and cause diagnosis in semiconductor manufacturing.

Hamideh Rostami, Jakey Blue, Argon Chen, Claude Yugma

Int. J. Intell. Syst., 2021

2020

A Structure Data-Driven Framework for Virtual Metrology Modeling.

Wei-Ting Yang, Jakey Blue, Agnès Roussy, Jacques Pinaton, Marco S. Reis

IEEE Trans Autom. Sci. Eng., 2020

A physics-informed Run-to-Run control framework for semiconductor manufacturing.

Wei-Ting Yang, Jakey Blue, Agnès Roussy, Jacques Pinaton, Marco S. Reis

Expert Syst. Appl., 2020

2018

Impact of integrating equipment health in production scheduling for semiconductor fabrication.

Yu-Ting Kao, Stéphane Dauzère-Pérès, Jakey Blue, Shi-Chung Chang

Comput. Ind. Eng., 2018

Automatic equipment fault fingerprint extraction for the fault diagnostic on the batch process data.

Hamideh Rostami, Jakey Blue, Claude Yugma

Appl. Soft Comput., 2018

Virtual Metrology Modeling based on Gaussian Bayesian Network.

Wei-Ting Yang, Jakey Blue, Agnès Roussy, Marco S. Reis, Jacques Pinaton

Proceedings of the 2018 Winter Simulation Conference, 2018

The Detection and the control of Machine/Chamber Mismatching in Semiconductormanufacturing.

Aabir Chouichi, Jakey Blue, Claude Yugma, François Pasqualini

Proceedings of the 2018 Winter Simulation Conference, 2018

Equipment Deterioration Modeling and Causes Diagnosis in Semiconductor Manufacturing.

Hamideh Rostami, Jakey Blue, Argon Chen, Claude Yugma

Proceedings of the 14th IEEE International Conference on Automation Science and Engineering, 2018

2017

Translation-Invariant Multiscale Energy-Based PCA for Monitoring Batch Processes in Semiconductor Manufacturing.

Tiago J. Rato, Jakey Blue, Jacques Pinaton, Marco S. Reis

IEEE Trans Autom. Sci. Eng., 2017

2016

Run-to-Run sensor variation monitoring for process fault diagnosis in semiconductor manufacturing.

Jakey Blue, Agnès Roussy, Jacques Pinaton

Proceedings of the Winter Simulation Conference, 2016

Equipment Condition Diagnosis and Fault Fingerprint Extraction in Semiconductor Manufacturing.

Hamideh Rostami, Jakey Blue, Claude Yugma

Proceedings of the 15th IEEE International Conference on Machine Learning and Applications, 2016

2015

Integration of scheduling and advanced process control in semiconductor manufacturing: review and outlook.

Claude Yugma, Jakey Blue, Stéphane Dauzère-Pérès, Ali Obeid

J. Sched., 2015

2014

Integration of scheduling and advanced process control in semiconductor manufacturing: review and outlook.

Claude Yugma, Jakey Blue, Stéphane Dauzère-Pérès, Philippe Vialletelle

Proceedings of the 2014 IEEE International Conference on Automation Science and Engineering, 2014

2011

Spatial Variance Spectrum Analysis and Its Application to Unsupervised Detection of Systematic Wafer Spatial Variations.

Jakey Blue, Argon Chen

IEEE Trans Autom. Sci. Eng., 2011

2009

Optimum sampling for track PEB CD Integrated Metrology.

Argon Chen, Sean Hsueh, Jakey Blue

Proceedings of the IEEE Conference on Automation Science and Engineering, 2009