Arijit Roy

Orcid: 0000-0002-9618-6641

Affiliations:
  • West Bengal State University, Department of Electronics, Kolkata, India
  • Nanyang Technological University, School of Electrical and Electronic Engineering, Singapore


According to our database1, Arijit Roy authored at least 6 papers between 2005 and 2017.

Collaborative distances:
  • Dijkstra number2 of six.
  • Erdős number3 of five.

Timeline

Legend:

Book 
In proceedings 
Article 
PhD thesis 
Dataset
Other 

Links

Online presence:

On csauthors.net:

Bibliography

2017
Multiple data access via a common cavity bus in circuit QED.
Int. J. Circuit Theory Appl., 2017

2009
Electromigration in width transition copper interconnect.
Microelectron. Reliab., 2009

2007
Room temperature observation of point defect on gold surface using thermovoltage mapping.
Microelectron. Reliab., 2007

2006
Experimental investigation on the impact of stress free temperature on the electromigration performance of copper dual damascene submicron interconnect.
Microelectron. Reliab., 2006

2005
Effect of vacuum break after the barrier layer deposition on the electromigration performance of aluminum based line interconnects.
Microelectron. Reliab., 2005

Effect of test condition and stress free temperature on the electromigration failure of Cu dual damascene submicron interconnect line-via test structures.
Microelectron. Reliab., 2005


  Loading...