Arijit Roy
Orcid: 0000-0002-9618-6641Affiliations:
- West Bengal State University, Department of Electronics, Kolkata, India
- Nanyang Technological University, School of Electrical and Electronic Engineering, Singapore
According to our database1,
Arijit Roy
authored at least 6 papers
between 2005 and 2017.
Collaborative distances:
Collaborative distances:
Timeline
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Bibliography
2017
Int. J. Circuit Theory Appl., 2017
2009
Microelectron. Reliab., 2009
2007
Room temperature observation of point defect on gold surface using thermovoltage mapping.
Microelectron. Reliab., 2007
2006
Experimental investigation on the impact of stress free temperature on the electromigration performance of copper dual damascene submicron interconnect.
Microelectron. Reliab., 2006
2005
Effect of vacuum break after the barrier layer deposition on the electromigration performance of aluminum based line interconnects.
Microelectron. Reliab., 2005
Effect of test condition and stress free temperature on the electromigration failure of Cu dual damascene submicron interconnect line-via test structures.
Microelectron. Reliab., 2005