Arkadiusz Glowacki

According to our database, Arkadiusz Glowacki authored at least 11 papers between 2004 and 2014.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2014

New degradation mechanism observed for AlGaN/GaN HEMTs with sub 100 nm scale unpassivated regions around the gate periphery.

Ponky Ivo, Eunjung Melanie Cho, Przemyslaw Kotara, Lars Schellhase, Richard Lossy, Ute Zeimer, Anna Mogilatenko, Joachim Würfl, Günther Tränkle, Arkadiusz Glowacki, Christian Boit

Microelectron. Reliab., 2014

Backside spectroscopic photon emission microscopy using intensified silicon CCD.

Arkadiusz Glowacki, Christian Boit, Philippe Perdu, Yoshitaka Iwaki

Microelectron. Reliab., 2014

2012

Comparison of FET electro-optical modulation for 1300 nm and 1064 nm laser sources.

Carlo Pagano, Christian Boit, Arkadiusz Glowacki, Reiner Leihkauf, Yoshiyuki Yokoyama

Microelectron. Reliab., 2012

Optimum Si thickness for backside detection of photon emission using Si-CCD.

Arkadiusz Glowacki, Christian Boit, Philippe Perdu

Microelectron. Reliab., 2012

2011

Comparative study of AlGaN/GaN HEMTs robustness versus buffer design variations by applying Electroluminescence and electrical measurements.

Ponky Ivo, Arkadiusz Glowacki, Eldad Bahat-Treidel, Richard Lossy, Joachim Würfl, Christian Boit, Günther Tränkle

Microelectron. Reliab., 2011

Performance improvement of Si-CCD detector based backside reflected light and photon emission microscopy by FIB ultimate substrate thinning.

Arkadiusz Glowacki, Christian Boit, Philippe Perdu

Microelectron. Reliab., 2011

Laser induced impact ionization effect in MOSFET during 1064 nm laser stimulation.

Sanjib Kumar Brahma, Arkadiusz Glowacki, Reiner Leihkauf, Christian Boit

Microelectron. Reliab., 2011

2009

Characterization of stress degradation effects and thermal properties of AlGaN/GaN HEMTs with photon emission spectral signatures.

Arkadiusz Glowacki, Piotr Laskowski, Christian Boit, Ponky Ivo, Eldad Bahat-Treidel, Reza Pazirandeh, Richard Lossy, Joachim Würfl, Günther Tränkle

Microelectron. Reliab., 2009

2008

Detectability of dynamic photon emission in static Si CCD for signal path determination in integrated circuits.

Piotr Laskowski, Arkadiusz Glowacki, Christian Boit

Microelectron. Reliab., 2008

2005

Seebeck Effect Detection on Biased Device without OBIRCH Distortion Using FET Readout.

Sanjib Kumar Brahma, Christian Boit, Arkadiusz Glowacki

Microelectron. Reliab., 2005

2004

Localization of FET Device Performance with Thermal Laser Stimulation.

Sanjib Kumar Brahma, Christian Boit, Arkadiusz Glowacki, Hiroyoshi Suzuki

Microelectron. Reliab., 2004