Arkan Abdulrahman

According to our database, Arkan Abdulrahman authored at least 5 papers between 2004 and 2009.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2009

Scalable Compact Test Pattern Generation for Path Delay Faults Based on Functions.

Edward Flanigan, Spyros Tragoudas, Arkan Abdulrahman

Proceedings of the 27th IEEE VLSI Test Symposium, 2009

2008

Low-power multi-core ATPG to target concurrency.

Arkan Abdulrahman, Spyros Tragoudas

Integr., 2008

Sequential Path Delay Fault Identification Using Encoded Delay Propagation Signatures.

Edward Flanigan, Arkan Abdulrahman, Spyros Tragoudas

Proceedings of the 9th International Symposium on Quality of Electronic Design (ISQED 2008), 2008

2006

Power-Aware Test Pattern Generation for Improved Concurrency at the Core Level.

Arkan Abdulrahman, Spyros Tragoudas

Proceedings of the 7th International Symposium on Quality of Electronic Design (ISQED 2006), 2006

2004

Compact ATPG for Concurrent SOC Testing.

Arkan Abdulrahman, Spyros Tragoudas

Proceedings of the Fifth International Workshop on Microprocessor Test and Verification (MTV 2004), 2004