Edward Flanigan

According to our database, Edward Flanigan authored at least 9 papers between 2006 and 2010.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2010

Identification of Delay Measurable PDFs Using Linear Dependency Relationships.

Edward Flanigan, Spyros Tragoudas

IEEE Trans. Very Large Scale Integr. Syst., 2010

2009

Scalable Compact Test Pattern Generation for Path Delay Faults Based on Functions.

Edward Flanigan, Spyros Tragoudas, Arkan Abdulrahman

Proceedings of the 27th IEEE VLSI Test Symposium, 2009

2008

Implicit Identification of Non-Robustly Unsensitizable Paths using Bounded Delay Model.

Dheepakkumaran Jayaraman, Edward Flanigan, Spyros Tragoudas

Proceedings of the 2008 IEEE International Test Conference, 2008

Sequential Path Delay Fault Identification Using Encoded Delay Propagation Signatures.

Edward Flanigan, Arkan Abdulrahman, Spyros Tragoudas

Proceedings of the 9th International Symposium on Quality of Electronic Design (ISQED 2008), 2008

A Novel Test Generation Methodology for Adaptive Diagnosis.

Rajsekhar Adapa, Edward Flanigan, Spyros Tragoudas

Proceedings of the 9th International Symposium on Quality of Electronic Design (ISQED 2008), 2008

2007

Function-based ATPG for Path Delay Faults using the Launch-Off-Capture Scan Architecture.

Edward Flanigan, Rajsekhar Adapa, Hailong Cui, Michael Laisne, Spyros Tragoudas, Tsvetomir Petrov

Proceedings of the 20th International Conference on VLSI Design (VLSI Design 2007), 2007

Enhanced Identification of Strong Robustly Testable Paths.

Edward Flanigan, Spyros Tragoudas

Proceedings of the 8th International Symposium on Quality of Electronic Design (ISQED 2007), 2007

Function-Based Test Generation for (Non-Robust) Path Delay Faults Using the Launch-off-Capture Scan Architecture.

Rajsekhar Adapa, Edward Flanigan, Spyros Tragoudas, Michael Laisne, Hailong Cui, Tsvetomir Petrov

Proceedings of the 8th International Symposium on Quality of Electronic Design (ISQED 2007), 2007

2006

An Improved Method for Identifying Linear Dependencies in Path Delay Faults.

Edward Flanigan, Themistoklis Haniotakis, Spyros Tragoudas

Proceedings of the 7th International Symposium on Quality of Electronic Design (ISQED 2006), 2006