Artur Lopes Ribeiro
Orcid: 0000-0002-7475-3422
According to our database1,
Artur Lopes Ribeiro
authored at least 30 papers
between 2008 and 2024.
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Bibliography
2024
Comparative Study on Ultrasonic C-Scan Imaging of Composite Lap Joints Using Piezoelectric Transducer: Pulse-Echo and Pitch-Catch Configurations.
IEEE Trans. Instrum. Meas., 2024
2023
Baseline-Free Damage Imaging of Composite Lap Joint via Parallel Array of Piezoelectric Sensors.
Sensors, November, 2023
Theoretical Predictions of Perturbed Magnetic Flux Density Components Due to Narrow Flaws in ECT.
IEEE Trans. Instrum. Meas., 2023
Polar Coordinate for Damage Imaging of Adhesively Bonded Plates Using Ultrasonic Guided Waves and Laser Doppler Vibrometer Measurements.
IEEE Trans. Instrum. Meas., 2023
Pulse-Echo and Pitch-Catch: Ultrasonic C-Scan of Adhesively Bonded Single Lap-joints.
Proceedings of the IEEE International Instrumentation and Measurement Technology Conference, 2023
2022
Locating and Imaging Fiber Breaks in CFRP Using Guided Wave Tomography and Eddy Current Testing.
Sensors, 2022
Guided Lamb wave tomography using angle beam transducers and inverse Radon transform for crack image reconstruction.
Proceedings of the IEEE International Instrumentation and Measurement Technology Conference, 2022
2020
Defect Classification With SVM and Wideband Excitation in Multilayer Aluminum Plates.
IEEE Trans. Instrum. Meas., 2020
2019
Locating Defects in Anisotropic CFRP Plates Using ToF-Based Probability Matrix and Neural Networks.
IEEE Trans. Instrum. Meas., 2019
Locating and Imaging Impact Damage with an Integrated System of PZT and Eddy Current Probe.
Proceedings of the IEEE International Instrumentation and Measurement Technology Conference, 2019
Proceedings of the IEEE International Instrumentation and Measurement Technology Conference, 2019
2018
Comparison of Inspecting Non-Ferromagnetic and Ferromagnetic Metals Using Velocity Induced Eddy Current Probe.
Sensors, 2018
Proceedings of the IEEE International Instrumentation and Measurement Technology Conference, 2018
Localization of defects in woven-fabric type CFRP plate by time of flight of scattering guided wave.
Proceedings of the IEEE International Instrumentation and Measurement Technology Conference, 2018
2017
Inspection of Cracks in Aluminum Multilayer Structures Using Planar ECT Probe and Inversion Problem.
IEEE Trans. Instrum. Meas., 2017
The dilation invariance principle in eddy-current non-destructive evaluation technique analytical justification.
Proceedings of the IEEE International Instrumentation and Measurement Technology Conference, 2017
2016
IEEE Trans. Instrum. Meas., 2016
2D geometry characterization of cracks from ECT image analysis using planar coils and GMR-sensors.
Proceedings of the IEEE International Instrumentation and Measurement Technology Conference, 2016
SVM classification of thickness and lift-off using transient eddy current oscillation method.
Proceedings of the IEEE International Instrumentation and Measurement Technology Conference, 2016
2015
Proceedings of the 2015 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) Proceedings, 2015
ECT image analysis applying an inverse problem algorithm with Tikhonov/TV Regularization.
Proceedings of the 2015 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) Proceedings, 2015
2014
Proceedings of the IEEE International Instrumentation and Measurement Technology Conference, 2014
2013
IEEE Trans. Instrum. Meas., 2013
Velocity induced eddy currents technique to inspect cracks in moving conducting media.
Proceedings of the IEEE International Instrumentation and Measurement Technology Conference, 2013
Proceedings of the IEEE International Instrumentation and Measurement Technology Conference, 2013
2011
Detection and characterization of defects using GMR probes and artificial neural networks.
Comput. Stand. Interfaces, 2011
A novel uniform eddy current probe with GMR for non destructive testing applications.
Proceedings of EUROCON 2011, 2011
Proceedings of EUROCON 2011, 2011
2010
IEEE Trans. Instrum. Meas., 2010
2008
IEEE Trans. Instrum. Meas., 2008